Charged particle beam apparatus

A charged particle beam apparatus, which is configured to automatically fabricate a sample piece from a sample, the charged particle beam apparatus comprising:

• a charged particle beam irradiation optical system configured to radiate a charged particle beam;
• a sample stage configured to move the sample that is placed on the sample stage;
• a sample piece transportation unit configured to hold and convey the sample piece separated and extracted from the sample;
• a holder fixing base configured to hold a sample piece holder to which the sample piece is transported;
• and
• a computer configured to determine a position of a target that is included in an image obtained by irradiation with the charged particle beam and perform control of the position of the target, based on the position that is determined:
• wherein the computer, in order to determine the position of the target, initially executes any one of a first determination or a second determination that is different from the first determination, determines the position of the target based on a result of the other one of the first determination or the second determination which is executed depending on a result of the one of the first determination or the second determination that is initially executed, and performs the control of the position based on the position that is determined,
• the first determination determines the position of the target based on template matching that uses a template about the target, and
• the second determination determines the position of the target based on a model of machine learning in which a result of pre-executed machine learning with regard to the position of the target included in the image is stored.