Microscopic imaging method using a correction factor

Microscopic imaging method, comprising:

• illuminating a specimen with illumination radiation and capturing detection radiation along a detection axis, said detection radiation having been caused by the illumination radiation, at a first time as a wide-field signal and at a second time as a composite signal,
• forming said composite signal by a superposition of a confocal signal and a wide-field signal,
• extracting the confocal signal by subtracting the wide-field signal from the composite signal, wherein a correction factor is used,
• ascertaining a current correction factor for each executed imaging and/or for each imaged specimen and
• extracting the confocal signal using the respective current correction factor,
• wherein, for the purposes of ascertaining the current correction factor in a correction plane chosen along the detection axis at a distance from a surface of the specimen, at least one correction wide-field image and one correction composite image are captured in each case, the image data thereof are ascertained and a current correction factor is ascertained on the basis of the ascertained image data;
• wherein the distance of the correction plane is chosen to be so large that no structures of the surface pass through the correction plane.