Processing-in-memory (PIM) devices and methods of testing the PIM devices

A processing-in-memory (PIM) device including a multiplication/accumulation (MAC) operator integrated in a memory device, the MAC operator comprising:

• a multiplying block including a first multiplier and a second multiplier, wherein the first multiplier is configured to perform a first multiplying calculation of data input to two first input terminals of the first multiplier, wherein first half data of first data and first half data of second data are inputted to respective ones of the two first input terminals, and the second multiplier is configured to perform a second multiplying calculation of data input to two second input terminals of the second multiplier, wherein second half data of the first data and second half data of the second data which are inputted to respective ones of the two second input terminals;
• and
• an adding block configured to perform an adding calculation of first multiplication result data outputted from the first multiplier and second multiplication result data outputted from the second multiplier,
• wherein the MAC operator is configured to receive a test mode signal having a first level to perform a test operation for the multiplying block by inputting the first half data of the first data and the first half data of the second data to respective ones of the two first input terminals and to respective ones of the two second input terminals and by executing the first multiplying calculation, the second multiplying calculation, and the adding calculation.