Memory system performance enhancements using measured signal and noise characteristics of memory cells

A method, comprising:

• transmitting, by a processing device in a memory sub-system, a command to a memory component of the memory sub-system to retrieve data from an address, the memory component being enclosed in an integrated circuit package and configured to, in response to the command and during execution of the command, measure signal and noise characteristics of a group of memory cells formed on an integrated circuit die using a calibration circuit;
• receiving, in the processing device from the memory component, the signal and noise characteristics measured by the calibration circuit during the execution of the command, the signal and noise characteristics including a plurality of measurements of a quantity at a plurality of voltages;
• processing, by the processing device of the memory sub-system, the signal and noise characteristics having the plurality of measurements of the quantity at the plurality of voltages;
• identifying, by the processing device of the memory sub-system, an attribute about the memory component based on the processing of the signal and noise characteristics;
• and
• performing, an operation related to data stored in the memory component based on the attribute.

A non-transitory computer storage medium storing instructions which, when executed by a computing system, cause the computing system to perform a method, the method comprising:

• transmitting, by a processing device in a memory sub-system, a command to a memory component of the memory sub-system, the command instructing the memory component to retrieve data from an address, wherein the memory component is enclosed in an integrated circuit package and is configured to, in response to the command and during execution of the command, measure signal and noise characteristics of a group of memory cells formed on an integrated circuit die using a calibration circuit;
• receiving, in the processing device from the memory component, the signal and noise characteristics measured by the calibration circuit during the execution of the command, the signal and noise characteristics including a plurality of measurements of a quantity at a plurality of voltages;
• processing, by the processing device of the memory sub-system, the signal and noise characteristics having the plurality of measurements of the quantity at the plurality of voltages;
• identifying, by the processing device of the memory sub-system, an attribute about the memory component based the processing of the signal and noise characteristics;
• and
• performing, an operation related to data stored in the memory component based on the attribute.