Apparatuses and methods for ZQ calibration

A method comprising:

• receiving an operating condition of a semiconductor device;
• determining whether the operating condition matches a condition stored in a register army;
• when it is determined the operating condition matches a condition stored in the register array:
• retrieving a ZQ calibration code from the register array associated with the matching condition;
• and
• providing the retrieved ZQ calibration code to an output circuit.

An apparatus comprising:

• a ZQ calibration control circuit comprising:
• a register array configured to store a plurality of first conditions;
• and
• a first comparator configured to be coupled to a first condition sensor and configured to:
• provide an active match signal if a value from the first condition sensor matches a respective condition of the plurality of first conditions in the register array;
• and
• provide an active ZQ calibration control signal if the value from the first condition sensor does not match any condition of the plurality of first conditions in the register array.