Infrared imaging microscope using tunable laser radiation

An imaging microscope for analyzing a sample having a first side and a second side, the imaging microscope comprising:

• a sample;
• a stage assembly that selectively moves the sample;
• a tunable laser source that is (i) tunable to emit a first laser beam having a first wavelength, and (ii) a subsequently tunable to emit a second laser beam having a second wavelength;
• an illumination lens assembly that directs the first laser beam at the first side of sample, the illumination lens assembly adjusting the first laser beam so that the first laser beam illuminates a two-dimensional illuminated area on the sample all at once;
• a reflection lens assembly that directs the second laser beam at the second side of sample, the reflection lens assembly adjusting the second laser beam so that the second laser beam illuminates a two-dimensional illuminated area on the sample all at once;
• an image sensor that includes a two-dimensional array of elements;
• an imaging lens assembly that gathers light from the sample and forms a two-dimensional, optical image of the sample on the image sensor without splitting and recombining the light collected from the sample;
• and
• a processor that receives first information from the image sensor when the first laser beam is directed at the sample, and second information from the image sensor when the second laser beam is directed at the sample.

A method for analyzing a sample, the method comprising:

• directing a first laser beam having a first wavelength in a mid-infrared range at the sample, and subsequently directing a second laser beam having a second wavelength in the mid-infrared range at the sample;
• providing an image sensor;
• gathering light from a plurality of points on the sample and forming a two-dimensional, optical image of the sample on the image sensor without splitting and recombining the gathered light with an imaging lens assembly;
• and
• detecting first information with the image sensor when the first laser beam is directed at the sample;
• and
• detecting second information with the image sensor when the second laser beam is directed at the sample.

An imaging microscope for analyzing a sample, the imaging microscope comprising:

• a tunable, laser source that is tunable to emit a first laser beam at a first wavelength, and subsequently tunable to emit a second laser beam at a second wavelength that is directed at the sample;
• wherein the first wavelength is different from the second wavelength;
• an illumination lens assembly that directs the first laser beam at the sample without splitting and recombining the first laser beam, the illumination lens assembly adjusting the first laser beam so that the first laser beam illuminates a two-dimensional illuminated area on the sample;
• an image sensor that includes a two-dimensional array of elements;
• an imaging lens assembly that gathers light from a plurality of locations on the sample and forms a two-dimensional, optical image of the sample on the image sensor;
• and
• a processor that receives first information from the image sensor when the first laser beam is directed at the sample, and second information from the image sensor when the second laser beam is directed at the sample.

An imaging microscope for analyzing a sample, the imaging microscope comprising:

• a tunable, laser source that is tunable to emit a first laser beam at a first wavelength, and subsequently tunable to emit a second laser beam at a second wavelength that is directed at the sample;
• wherein the first wavelength is different from the second wavelength;
• a reflection lens assembly that directs the first laser beam at the sample without splitting and recombining the first laser beam, the reflection lens assembly adjusting the first laser beam so that the first laser beam illuminates a two-dimensional illuminated area on the sample;
• an image sensor that includes a two-dimensional array of elements;
• an imaging lens assembly that gathers light from a plurality of locations on the sample and forms a two-dimensional, optical image of the sample on the image sensor;
• and
• a processor that receives first information from the image sensor when the first laser beam is directed at the sample, and second information from the image sensor when the second laser beam is directed at the sample.

An imaging microscope for analyzing a sample, the imaging microscope comprising:

• a tunable, laser source that is tunable to emit a first laser beam at a first wavelength that is directed at the sample, and subsequently tunable to emit a second laser beam at a second wavelength that is directed at the sample;
• wherein the first wavelength is different from the second wavelength;
• an image sensor that includes a two-dimensional array of elements;
• an imaging lens assembly that gathers light from a plurality of locations on the sample and forms a two-dimensional, optical image of the sample on the image sensor without splitting and recombining the received rays;
• and
• a processor that receives first information from the image sensor when the first laser beam is directed at the sample, and second information from the image sensor when the second laser beam is directed at the sample.

A method for analyzing a sample, the method comprising:

• directing a first laser beam having a first wavelength in a mid-infrared range at the sample with an illumination lens assembly without splitting and recombining the first laser beam, and subsequently directing a second laser beam having a second wavelength in the mid-infrared range at the sample;
• providing an image sensor;
• gathering light from a plurality of points on the sample and forming a two-dimensional, optical image of the sample on the image sensor with an imaging lens assembly;
• and
• detecting first information with the image sensor when the first laser beam is directed at the sample;
• and
• detecting second information with the image sensor when the second laser beam is directed at the sample.

A method for analyzing a sample having a first side and a second side, the method comprising:

• directing a first laser beam having a first wavelength in a mid-infrared range at the first side of the sample with an illumination lens assembly without splitting and recombining the first laser beam, and subsequently directing a second laser beam having a second wavelength in the mid-infrared range at the second side of the sample with a reflection lens assembly without splitting and recombining the second laser beam;
• providing an image sensor;
• gathering light from a plurality of points on the sample and forming a two-dimensional, optical image of the sample on the image sensor with an imaging lens assembly;
• and
• detecting first information with the image sensor when the first laser beam is directed at the sample;
• and
• detecting second information with the image sensor when the second laser beam is directed at the sample.