Method for determining fast charge performance of a negative electrode plate and method for designing a negative electrode plate
AssigneeContemporary Amperex Technology Co., Limited
InventorsJiazheng Wang, Meng Kang, Xiaobin Dong, Yuliang Shen, Libing He
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Abstract
The present application provides a method for determining fast charge performance of a negative electrode plate and a method for designing a negative electrode plate. By utilizing the method(s) according to the present application, the charging speed of a negative electrode plate can be quickly evaluated and the design period of a negative electrode plate in a fast charge battery can be greatly shortened.
Claims15
A method for determining fast charge performance of a negative electrode plate, the negative electrode plate comprising a negative active material, a conductive additive, and a binder, characterized in that the method comprises:
- determining fast charge performance of the negative electrode plate according to an empirical formula A=CW*(PD−1)*(OL−D50+D90)/(w*100), wherein:
- in case A<16, the negative electrode plate is applicable to a fast charge battery at a constant current rate of 10 C or higher;
- in case 16<A<85, the negative electrode plate is applicable to a fast charge battery at a constant current rate of 4 C-10 C;
- in case 85<A<110, the negative electrode plate is applicable to a fast charge battery at a constant current rate of 2 C-4 C;
- and
- in case A>110, the negative electrode plate is applicable to a fast charge battery at a constant current rate of lower than 2 C;
- and in the empirical formula,
- CW represents the coating weight CW of the negative electrode plate, expressed in mg/cm″:
- PD represents the press density of coating on the negative electrode plate, expressed in g/cm}:
- OI represents the orientation index of the negative electrode plate as measured by using X-ray powder diffractometer according to X-ray diffraction analysis method and lattice parameter determination method of graphite, and calculating according to formula OI=C004/C110, wherein C004 was peak area of 004 characteristic diffraction peak and C110 was peak area of 110 characteristic diffraction peak;
- DS50 represents the particle size which corresponds to 50% of the cumulative volume percentage of negative active material in the negative electrode plate, expressed in μm;
- D90 represents the particle size which corresponds to 90% of the cumulative volume percentage of the negative active material in the negative electrode plate, expressed in μm;
- D50 and D90 are measured using a laser diffraction particle size distribution measuring instrument according to the laser diffraction method for measuring particle size distribution;
- and
- w represents the mass percentage of active carbon atoms in the negative active material of the negative electrode plate, relative to the mass of the negative active material, and w is measured according to the description;
- and
- wherein the negative active material of the negative electrode plate fulfills the conditions that w is from 1% to 10% and D50 is from 5 μm to 15 μm, and wherein the negative active material of the negative electrode plate comprises one or more of artificial graphite and natural graphite;
- the weight percentage of graphite material in the negative active material is higher than 90%;
- and the coating weight CW of the negative electrode plate is further controlled in the range of from 5 mg/cm2 to 13 mg/cm2.
Dependencies are inferred from the claim text.