Semiconductor test socket with a floating plate and latch for holding the semiconductor device

A test socket assembly for a semiconductor device, comprising:

• a base assembly including a pin assembly for electrically coupling to the semiconductor device for burn-in;
• a floating plate slidably coupled to the base assembly;
• and
• opposing latches mounted on the floating plate for movement therewith and for retaining the semiconductor device thereto, wherein the floating plate and the opposing latches move to a test position for accommodating a varying height of the semiconductor device when mating with a test fixture while the latch still effectively retains the semiconductor device, wherein each latch includes an upstanding clamp portion and a horizontal lever portion that is in contact with a latch spring.

A test socket assembly for a semiconductor device, comprising:

• a base assembly including a pin assembly for electrically coupling to the semiconductor device for burn-in and at least one upstanding flex arm;
• at least one floating plate slidably coupled to the base assembly;
• and
• at least one latch assembly mounted on the at least one floating plate for movement therewith and for retaining the semiconductor device thereto, wherein the at least one floating plate and the at least one latch assembly move to a test position for accommodating a varying height of the semiconductor device when mating with a test fixture while the latch still effectively retains the semiconductor device and the at least one upstanding flex arm supports the floating plate in a fixed load position when inserting the semiconductor device into the test socket assembly, wherein each latch of the at least one latch assembly includes an upstanding clamp portion and a horizontal lever portion that is in contact with a latch spring.