Automatic detection of logical path segments in a measurement population
AssigneeTektronix, Inc.
InventorsKeith D. Rule, Sean T. Marty
Life of this patent
Estimating the term…
Abstract
A test and measurement instrument, including a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one or more logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display.
Claims20
A test and measurement instrument, comprising:
- a memory configured to store a waveform data record;
- one or more processors configured to:
- receive the waveform data record,
- determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record,
- detect one or more logical path segments associated with the measurement values for the plurality of occurrences of the measurement event, and
- generate a visual representation of each measurement value and overlay each of the visual representations of each measurement value;
- and
- a display configured to display the visual representations of the measurement values.
A method for automatically detecting logical path segments in a measurement population, comprising:
- determining a measurement value and location for a plurality of occurrences of a measurement event in a waveform data record;
- detecting one or more logical path segments associated with the measurement values for the plurality of occurrences of the measurement event;
- generating a visual representation of each measurement value and overlaying each visual representation of each measurement value;
- and
- displaying on a display each visual representation of each measurement value.
One or more non-transitory computer-readable storage media comprising instructions, which, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to:
- determine a measurement value and location for a plurality of occurrences of a measurement event in a waveform data record;
- detect one or more logical path segments associated with the measurement values for the plurality of occurrences of the measurement event;
- generate a visual representation of each measurement value and overlay each of the visual representations of each measurement value;
- and
- display on a display the overlaid visual representations of each measurement value.
Dependencies are inferred from the claim text.