Back to results
US 11,237,176 B2Granted
Infrared assay detecting secondary structure profiles of alpha-synuclein
AssigneeProthena Biosciences Limited
InventorRobin Barbour
Life of this patent
Estimating the term…
Abstract
The invention provides an infrared assay which allows the secondary structure analysis of alpha-synuclein from complex fluids like serum, blood plasma or cerebrospinal fluid without prior isolation, concentration or pretreatment. The secondary structure profile provides an indication of the proportion of alpha-synuclein in aggregated form and/or extent of aggregation of alpha-synuclein in aggregated form.
Claims26
A method for determining a profile of secondary structure of alpha-synuclein in a sample, comprising:
- a. introducing the sample into a cell comprising an infrared source, an infrared sensor element linked to an antibody, wherein the antibody is an antibody comprising CDRs H1, H2 and H3 of SEQ ID NOS:12-14 respectively and CDRs L1, L2 and L3 of SEQ ID NOS:15-17 respectively, and an infrared detector, whereby alpha-synuclein in the sample binds to the antibody on the surface of the infrared sensor element;
- b. submitting an infrared beam from the infrared source through the infrared sensor to the infrared detector to obtain an infrared spectrum characterizing the alpha-synuclein of the sample;
- and
- c. analyzing the obtained infrared spectrum to determine a secondary structure profile of the alpha-synuclein in the sample.
1 more element
Dependencies are inferred from the claim text.