Electronic device testing system, electronic device production system including same and method of testing an electronic device

An electronic device production system comprising:

• an electronic device printing system configured to print an electronic device including receiving a substrate, printing an electronic circuit on a given area of the substrate using an ink and printing a metamaterial structure on a remaining area of the substrate using the ink, the metamaterial structure comprising a pattern of elements providing a terahertz resonance frequency to the metamaterial structure;
• and
• an electronic device testing system being adapted to receive the previously printed substrate, the electronic device testing system comprising a terahertz radiation emitter configured to emit an incident terahertz radiation beam to be incident on the metamaterial structure of the substrate, the incident terahertz radiation beam having power at least at the terahertz resonance frequency of the metamaterial structure, a terahertz radiation receiver configured to receive an outgoing terahertz radiation beam outgoing from the metamaterial structure and to measure an amplitude of an electric field of the outgoing terahertz radiation beam at least at the terahertz resonance frequency;
• and a controller configured to determine a conductivity value indicative of a conductivity of the ink based on said amplitude and to generate a signal indicative of an action to be performed when the determined conductivity of the ink is below a given conductivity threshold.

A method for testing an electronic device having an electronic circuit being printed on a given area of a substrate using an ink and a metamaterial structure being printed on a remaining area of the substrate, the metamaterial structure comprising a pattern of elements providing a terahertz resonance frequency to the metamaterial structure using the ink, the method comprising:

• emitting a terahertz radiation emitter incident on the metamaterial structure of the substrate, the incident terahertz radiation beam having power at least at the terahertz resonance frequency of the metamaterial structure, thereby causing an outgoing terahertz radiation beam to be outgoing from the metamaterial structure;
• the metamaterial structure modifying a first spectral power distribution of the incident terahertz beam and thereby causing an outgoing terahertz radiation beam to have a second spectral power distribution being different from the first spectral power distribution;
• measuring an amplitude of an electric field of the outgoing terahertz radiation beam at least at the terahertz resonance frequency;
• and
• using a controller being communicatively coupled to at least the terahertz radiation receiver, determining a conductivity value indicative of a conductivity of the ink based on said amplitude.