Device for analyzing sensitivity of object using frequency response and analyzing method using the same

A sensitivity analyzing device using frequency response, the device comprising:

• a vibration exciter configured to configure a vibration exciting pattern and apply a physical force to one face of a test object based on the vibration exciting pattern;
• a first sensor in contact with the one face of the test object to measure a physical force applied to the test object by the vibration exciter;
• a second sensor in contact with an opposite face of the test object to the one face to collect a vibration of the test object caused by the physical force;
• and
• a sensitivity analyzer configured to:
• control the vibration exciter to configure the vibration exciting pattern;
• convert the physical force signal measured by the first sensor and the vibration signal collected by the second sensor in responses to the vibration exciting pattern into frequency domain signals to calculate a frequency response function of the test object;
• and
• calculate a sensitivity index of the test object to a variation in a physical external force, based on the frequency response function,
• wherein the test object is made of a material having a single orientation of a predefined angle, and
• wherein the sensitivity analyzer is configured to calculate the frequency response function based on a frequency spectrum pattern of the physical force applied to the test object and the orientation angle of the material thereof, or wherein the sensitivity analyzer is configured to calculate the sensitivity index based on the frequency spectrum pattern of the physical force applied to the test object and an orientation sensitivity index based on the orientation angle.