System and method for binning at final test
AssigneeOptimal Plus Ltd.
InventorsReed Linde, Gill Balog
Life of this patent
Estimating the term…
Abstract
Systems and methods for sorting an electronic device undergoing a final test operation in accordance with a test program, into one of a plurality of bins. In one embodiment, an evaluator defines the binning of the electronic device while the device is still socketed, and the defined binning may or may not concur with the binning assigned by the test program.
Claims20
A system for sorting an electronic device, comprising:
- memory configured to store a provisional binning assignment for the electronic device determined from first data generated by a test tool that is performing a test operation on the electronic device according to a test program;
- an interface coupled to the memory and more than one data source external to the test tool;
- and
- an evaluator coupled to the memory and the interface, the evaluator is configured to:
- receive the first data and the provisional binning assignment for the electronic device generated by the test program;
- receive second data from the more than one data source external to the test tool through the interface;
- combine the second data from the more than one data source external to the test tool;
- define a permanent binning assignment for the electronic device based at least in part on the first data and combined second data from the more than one data source external to the test tool;
- and
- output the permanent binning assignment so that after the test operation is completed, the electronic device is removed from the test tool and placed in one of a plurality of bins according to the permanent binning assignment.
A method of sorting an electronic device, comprising:
- receiving first data generated by a test tool that is performing a test operation on the electronic device according to a test program, and a provisional binning assignment for the electronic device determined from the first data;
- receiving second data from more than one data source external to the test tool;
- combining the second data from the more than one data source external to the test tool;
- defining a permanent binning assignment for the electronic device based at least in part on the first data and combined second data from the more than one data source external to the test tool;
- and
- outputting the permanent binning assignment so that after the test operation is completed, the electronic device is removed from the test tool and placed in one of a plurality of bins according to the permanent binning assignment.
A non-transitory computer program product comprising a computer useable medium having computer readable program code embodied therein for sorting an electronic device, the non-transitory computer program product further comprising:
- computer readable program code for causing a computer to:
- receive first data generated by a test tool that is performing a test operation on the electronic device according to a test program, and a provisional binning assignment for the electronic device determined from the first data;
- receive second data from more than one data source external to the test tool;
- combine the second data from the more than one data source external to the test tool;
- define a permanent binning assignment for the electronic device based at least in part on the first data and combined second data from the more than one data source external to the test tool;
- and
- output the permanent binning assignment so that after the test operation is completed, the electronic device is removed from the test tool and placed in one of a plurality of bins according to the permanent binning assignment.
Dependencies are inferred from the claim text.