Memory sub-system retirement determination

An apparatus, comprising:

• a memory device;
• and
• a processing device coupled to the memory device and configured to:
• perform a particular quantity of write cycles on data in a memory die;
• determine a first statistical boundary value associated with a plurality of fail bit count values determined at a target codeword error rate of the memory die that is associated with an error having a first drift time associated therewith;
• determine a second statistical boundary value associated with a plurality of fail bit count values determined at a target codeword error rate of a memory die that is associated with an error having a second drift time associated therewith;
• and
• compare:
• the first statistical boundary value with a first error parameter value corresponding to a particular quantity of write cycles and to the first drift time;
• and
• the second statistical boundary value with a second error parameter value corresponding to the particular quantity of write cycles and to the second drift time.

A system, comprising:

• a memory sub-system comprising a plurality of memory components arranged to form a stackable cross-gridded array of memory cells;
• and
• a processing device coupled to the plurality of memory components, the processing device to perform operations comprising:
• performing a particular quantity of write cycles on data in one of the memory components;
• determining a first statistical boundary value associated with a plurality of codeword error rate values determined at a target fail bit count value of the one memory component that is associated with a first drift time;
• determining a second statistical boundary value associated with a plurality of codeword error rate values determined at a target fail bit count value of the one memory component that is associated with a second drift time;
• and
• comparing:
• the first statistical boundary value with a first error parameter values corresponding to a particular quantity of write cycles and to the first drift time;
• and
• the second statistical boundary value with a second error parameter values corresponding to the particular quantity of write cycles and to the second drift time.