Methods and apparatus for estimating the wear of a non-volatile memory
AssigneeHyperstone GmbH
InventorsSteffen Allert, Martin Roeder, Christoph Baumhof
Life of this patent
Estimating the term…
Abstract
Some embodiments relate to a method and a corresponding apparatus for estimating the wear of a non-volatile memory. Such a method may include determining a load profile with respect to a real access load occurring during a defined test period where the load profile indicates a respectively associated access load for accesses to a first NVM, and generating access data representing the determined load profile. The method further includes determining an estimated value for the wear of a particular second NVM in part on the basis of the access data.
Claims20
A method for estimating a wear of a non-volatile memory (NVM), wherein the method comprises:
- determining a load profile with respect to a real access load occurring during a defined test period, wherein the determined load profile indicates, for a plurality of different access types, a respectively associated access load for accesses to a first NVM, and generating access data representing the determined load profile;
- and
- determining an estimated value for a wear of a particular second NVM on a basis of the access data and of a set of parameters which characterizes a wear-relevant physical or functional property of the second NVM or of a memory controller associated therewith for controlling the second NVM;
- wherein the determining the estimated value for the wear comprises:
- determining the estimated value for the wear of the particular second NVM during the defined test period, which is indicative of a thereby occurring total number of accesses which is determined as a function of the determined load profile and the set of parameters.
A non-transitory computer readable medium, the non-transitory computer readable medium including instructions executable by a memory control system to:
- determine a load profile with respect to a real access load occurring during a defined test period, wherein the load profile indicates, for a plurality of different access types, a respectively associated access load for accesses to a first NVM, and generating access data representing the determined load profile;
- and
- determine an estimated value for the wear of a particular second NVM on a basis of the access data and of a set of parameters which characterizes a wear-relevant physical or functional property of the second NVM or of a memory controller associated therewith for controlling the second NVM;
- wherein the determining the estimated value for the wear of the particular second NVM comprises:
- determining a gross amount of data caused by the accesses to the first NVM during the test period, which is indicative of a thereby occurring total number of accesses which is determined as a function of the determined load profile and the set of parameters.
An apparatus for estimating a wear of a NVM, wherein the apparatus is operable to:
- determine, by a processor, a load profile with respect to a real access load occurring during a defined test period, wherein the load profile indicates, for a plurality of different access types, a respectively associated access load for accesses to a first NVM, and generating access data representing the determined load profile;
- and
- determine, by the processor, an estimated value for a wear of a particular second NVM on the basis of the access data and of a set of parameters which characterizes a wear-relevant physical or functional property of the particular second NVM or of a memory controller associated therewith for controlling the particular second NVM;
- wherein the determining the estimated value for the wear comprises:
- determining a gross amount of data caused by the accesses to the first NVM during the defined test period, which is indicative of a thereby occurring total number of accesses which is determined as a function of the determined load profile and the set of parameters.
Dependencies are inferred from the claim text.