Method, device and system for health monitoring of system-on-chip

A device for health monitoring of System-on-Chip (SoC), comprising:

• a data acquisition module, configured to acquire in real time a plurality of sensor data of a plurality of sensors monitoring System-on-Chip (SoC) performance, the sensor data including reliability degradation sensor data, temperature sensor data, noise sensor data and current sensor data;
• wherein the plurality of sensors include a reliability degradation sensor, a temperature sensor, a noise sensor, and a current sensor;
• an analysis and prediction module, configured to extract a characteristic data representative of the System-on-Chip (SoC) performance from the sensor data and perform analysis and prediction on the characteristic data representative in real time by using a prediction algorithm to obtain a real-time performance state and a real-time performance degradation trend of the System-on-Chip (SoC);
• and
• an information output module, configured to output a real-time prediction testing result including real-time performance state information and real-time performance degradation trend information of the System-on-Chip (SoC);
• and
• a plurality of pre-set sensor drivers for reading the sensor data of the plurality of sensors monitoring SoC performance in real time directly;
• the pre-set sensor drivers are directly connected to an operation system kernel;
• the pre-set sensor drivers are configured and based on the operation system kernel;
• and wherein the sensor data is acquired by the operation system kernel directly;
• an interface provided by the operation system kernel for acquiring in real time the sensor data read by the pre-sensor drivers;
• and
• wherein, direct monitoring of performance degradation of the SoC is done by the real-time prediction testing result using the real-time characteristic data representative instead of indirectly monitoring performance degradation using actual values of specific electrical characteristics.

An System-on-Chip (SoC) system, comprising:

• a system hardware layer, a system kernel layer, a system service layer and an application layer;
• wherein, a plurality of sensors of the system hardware layer are configured to monitor SoC performance in real time;
• wherein the plurality of sensors include a reliability degradation sensor, a temperature sensor, a noise sensor, and a current sensor;
• an operation system kernel of the system kernel layer is configured to acquire in real-time sensor data of the system hardware layer, and transmit the sensor data to the system service layer;
• the sensor data comprises reliability degradation sensor data, temperature sensor data, noise sensor data and current sensor data;
• a prediction module of the system service layer is configured to extract a characteristic data representative of the System-on-Chip (SoC) performance from the sensor data and perform analysis and prediction on the characteristic data in real-time by using a prediction algorithm to obtain a real-time performance state and a real-time performance degradation trend of the System-on-Chip (SoC);
• and
• an application pre-set in the application layer is configured to output a real-time prediction testing result including real-time performance state information and real-time performance degradation trend information of the System-on-Chip (SoC) system;
• a plurality of pre-set sensor drivers for reading the sensor data of the plurality of sensors monitoring SoC performance in real time directly;
• the pre-set sensor drivers are directly connected to the operation system kernel;
• the pre-set sensor drivers are configured based on the operation system kernel;
• and wherein the sensor data is acquired by the operation system kernel directly;
• an interface provided by the operation system kernel for acquiring in real time the sensor data read by the pre-sensor drivers;
• and
• wherein, direct monitoring of performance degradation of the SoC is done by the real-time prediction testing result using the real-time characteristic data representative instead of indirectly monitoring performance degradation using actual values of specific electrical characteristics.