Arrangement, microscope and method for TIRF microscopy

An arrangement for total-internal reflection fluorescence microscopy (TIRF microscopy), comprising

• an illumination optical unit with an illumination objective for illuminating a specimen situated on a specimen carrier in a specimen region of a specimen plane via an illumination beam path, wherein
• an optical axis of the illumination objective includes an illumination angle that differs from zero with the normal of the specimen plane, in respect of which the specimen carrier is aligned,
• a detection optical unit with, a detection objective in a detection beam path having an optical axis which includes a detection angle that differs from zero with the normal of the specimen plane,
• a transition element located between the specimen carrier and the illumination and detection objectives, said transition element being arranged both in the illumination beam path and in the detection beam path;
• the transition element is configured to correct aberrations that arise on account of the passage through media with different refractive indices of radiation to be detected and/or radiation for illuminating the specimen, and
• wherein the illumination beam path is directed into the specimen region of the specimen plane at an illumination angle suitable for producing total-internal reflection of the illumination radiation at the specimen plane.