Inspection apparatus and inspection method thereof
AssigneeWistron Corporation
InventorsChung Kai Han, Yu Shan Huang, Po-Chuan Ku, Chun Yen Tsai
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AssigneeWistron Corporation
InventorsChung Kai Han, Yu Shan Huang, Po-Chuan Ku, Chun Yen Tsai
Estimating the term…
Inspection apparatus is provided for inspecting a first electronic device and a second electronic device. The inspection apparatus includes a first signal transfer unit, a second signal transfer unit, a first signal output unit and a second signal output unit. The first signal transfer unit is adapted to receive a first input signal. The second signal transfer unit is adapted to receive a second input signal. The first signal output unit is selectively coupled to the first signal transfer unit or the second signal transfer unit to output a first output signal to inspect the first electronic device. The second signal output unit is selectively coupled to the first signal transfer unit or the second signal transfer unit to output a second output signal to inspect the second electronic device. The inspection apparatus can realize automatic inspection.
An inspection apparatus, for inspecting a first electronic device and a second electronic device, comprising:
An inspection apparatus, for inspecting a first electronic device and a second electronic device, comprising:
Dependencies are inferred from the claim text.