Back to results
US 11,231,463 B2Granted
Programmable test compression architecture input/output shift register coupled to SCI/SCO/PCO
AssigneeTexas Instruments Incorporated
InventorLee D. Whetsel
Life of this patent
Estimating the term…
Abstract
The disclosure describes novel methods and apparatuses for accessing test compression architectures (TCA) in a device using either a parallel or serial access technique. The serial access technique may be controlled by a device tester or by a JTAG controller. Further the disclosure provides an approach to access the TCA of a device when the device exists in a daisy-chain arrangement with other devices, such as in a customer's system. Additional embodiments are also provided and described in the disclosure.
Claims17
A programmable access test compression architecture comprising:
- (a) functional logic having stimulus inputs and response outputs;
- (b) scan path circuits, each scan path circuit having a scan input, a scan output, stimulus outputs coupled to the stimulus inputs of the functional logic, and response inputs coupled to the response outputs of the functional logic;
- (c) decompressor circuitry having compressed data inputs and having outputs coupled to the scan inputs of the scan path circuits;
- (d) a serial compressed data input;
- (e) parallel compressed data inputs;
- (f) an input shift register having a serial input coupled to the serial compressed data input, and parallel outputs;
- (g) multiplexer circuitry having first inputs connected to the parallel compressed data inputs, second inputs connected to the parallel outputs of the input shift register, parallel outputs connected to the compressed data inputs of the compressor circuitry, and a select input;
- and
- (h) test access port circuitry having a test data input, and instruction register circuitry coupled to the test data input, the instruction register circuitry having an output coupled to the select input.
6 more elements
Dependencies are inferred from the claim text.