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US 11,231,459 B2Granted
Method and apparatus for analyzing phase noise in a signal from an electronic device
AssigneeJitterLabs LLC
InventorGary Giust
Life of this patent
Estimating the term…
Abstract
An apparatus and method for analyzing phase noise in a signal. A plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test at a corresponding offset frequency, and filter data representing filter characteristics on a first side of a spectrum boundary, are used to derive filtered signal samples. A measure of noise is derived from the filtered signal samples. This abstract is not to be considered limiting, since other embodiments may deviate from the features described in this abstract.
Claims24
An apparatus, comprising:
- a) an input unit to receive a signal-under-test (SUT);
- b) a noise-measurement unit to convert the SUT into signal data;
- c) a processing unit;
- d) memory connected to the processing unit with sufficient storage for the processing unit to perform its operations;
- and
- e) programming instructions for the processing unit that causes the processing unit to:
- i) receive the signal data,
- ii) derive a plurality of signal samples on a first side of a spectrum boundary from the signal data, each signal sample representing a value of phase noise at a corresponding offset frequency, wherein the deriving comprises representing phase noise located on a second side of the spectrum boundary that folds across the spectrum boundary onto the first side of the spectrum boundary, and
- iii) filter on the first side of the spectrum boundary the signal samples in accordance with filter data representing filter characteristics of an application system.
6 more elements
A method comprising:
- a) using a noise-measurement system to derive a plurality of signal samples, each signal sample representing a value of phase noise in a signal-under-test (SUT) at a corresponding offset frequency;
- b) creating derived signal samples on a first side of a spectrum boundary from the plurality of signal samples, wherein the creating comprises representing phase noise located on a second side of the spectrum boundary that folds across the spectrum boundary onto the first side of the spectrum boundary;
- and
- c) filtering on the first side of the spectrum boundary the derived signal samples in accordance with filter data representing filter characteristics of an application system.
1 more element
A method comprising:
- a) using a noise-measurement system to derive a plurality of signal samples on a first side of a spectrum boundary from a signal-under-test (SUT), each signal sample representing a value of phase noise in the SUT at a corresponding offset frequency;
- b) creating estimated higher-frequency signal samples by determining a single value based on at least one of the signal samples in the plurality of signal samples, wherein the at least one of the signal samples is proximal to the spectrum boundary, and using the single value for all signal samples in the estimated higher-frequency signal samples to represent phase noise on a second side of the spectrum boundary;
- c) filtering a set of signal samples created from the plurality of signal samples and the estimated higher-frequency signal samples in accordance with filter data representing filter characteristics of an application system;
- and
- d) deriving a measure of noise from the filtered signal samples.
2 more elements
Dependencies are inferred from the claim text.