Apparatus for testing integrated circuit devices and method thereof
AssigneeUPE CO., Ltd.
InventorsEon Seok Sung, Moo Jong Shin
Life of this patent
Estimating the term…
Abstract
An apparatus for performing a test on an integrated circuit device is provided. The apparatus includes a processor, at least one mounting portion configured to accommodate at least one integrated circuit device to be tested, and an interface configured to connect the processor to the at least one integrated circuit device to allow data transmission and reception therebetween. The processor is configured to transfer a heating traffic data pattern, which is configured to raise a temperature of the at least one integrated circuit device to a target temperature according to heating test conditions, to the at least one integrated circuit device via the interface.
Claims16
An apparatus for testing an integrated circuit device, the apparatus comprising:
- a processor;
- at least one mounting portion configured to accommodate at least one integrated circuit device to be tested;
- and
- an interface configured to connect the processor to the at least one integrated circuit device to allow data transmission and reception therebetween,
- wherein the processor is configured to transfer a heating traffic data pattern, which is configured to raise a temperature of the at least one integrated circuit device using heat generated by the at least one integrated circuit device itself to a target temperature according to heating test conditions, to the at least one integrated circuit device via the interface,
- wherein the processor is configured to transfer a test traffic data pattern to be used for testing an operation of the at least one integrated circuit device to the at least one integrated circuit device in response to a determination that the temperature of the at least one integrated circuit device has reached the target temperature, and
- wherein the processor adjusts the heating traffic data pattern to maintain the at least one integrated circuit device within a target temperature range while transmitting the test traffic data pattern.
A method of testing an integrated circuit device by a processor, the processor being configured to transmit and receive data to and from at least one integrated circuit device to be tested via an interface, the method comprising:
- receiving information on each temperature of the at least one integrated circuit device from each temperature sensor embedded in the at least one integrated circuit device via the interface;
- determining whether each temperature of the at least one integrated circuit device has reached a target temperature according to heating test conditions based on the received information on the temperature;
- transferring a heating traffic data pattern, which is configured to raise the temperature of the at least one integrated circuit device using heat generated by the at least one integrated circuit device itself to the target temperature, to the at least one integrated circuit device via the interface in response to a determination that each temperature of the at least one integrated circuit device has not reached the target temperature;
- applying a test traffic data pattern to be used for testing an operation of the at least one integrated circuit device, to the at least one integrated circuit device;
- and
- adjusting the heating traffic data pattern to maintain the at least one integrated circuit device within a target temperature range while applying the test traffic data pattern.
A method of testing an integrated circuit device by a processor, the method comprising:
- preparing at least one integrated circuit device to be tested;
- applying a heating traffic data pattern, which is configured to change a temperature of the at least one integrated circuit device using heat generated by the at least one integrated circuit device itself to a target temperature, to the at least one integrated circuit device;
- applying a test traffic data pattern to be used for testing an operation of the at least one integrated circuit device, to the at least one integrated circuit device;
- and
- adjusting the heating traffic data pattern to maintain the at least one integrated circuit device within a target temperature range while applying the test traffic data pattern.
A method of testing an integrated circuit device by a processor, the method comprising:
- receiving information on a temperature of each of at least one integrated circuit device;
- performing temperature control for each of the at least one integrated circuit device using heat generated by the at least one integrated circuit device itself based on the information on the temperature;
- applying a test traffic data pattern to be used for testing an operation of the at least one integrated circuit device, to at least one integrated circuit device;
- and
- adjusting temperature of each of the at least one integrated circuit device using heat generated by the at least one integrated circuit itself to maintain the at least one integrated circuit device within a target temperature range while applying the test traffic data pattern.
Dependencies are inferred from the claim text.