Acquiring and displaying multiple waveforms in a test and measurement instrument

One or more non-transitory computer-readable storage media comprising instructions, which, when executed by one or more processors of a test and measurement instrument, cause the test and measurement instrument to:

• display a waveform viewing area;
• receive a selection of a viewing mode;
• when an overlay mode is selected, display two or more waveforms overlaid in a single graticule in the waveform viewing area;
• and
• when a stacked mode is selected, display a first waveform in a first slice in the waveform viewing area and display a second waveform in a second slice below the first slice in the waveform viewing area, wherein the first slice and the second slice are time-aligned and have the same horizontal axis and the first slice and the second slice each have independent vertical axes.

A test and measurement instrument, comprising:

• a display;
• and
• one or more processors configured to:
• display a waveform viewing area having two or more slices displayed in a stacked manner, each slice associated with at least one waveform, wherein the two or more slices are time-aligned and have the same horizontal axis and the two or more slices each have independent vertical axes;
• display in a badge viewing area a badge associated with each waveform in the waveform viewing area, the badges displayed in order of the two or more slices;
• receive a user input to reorder the badges displayed in the badge viewing area;
• and
• in response to the reordering of the badges, reorder the two or more slices in the order of the reordered badges.