Automatic analysis device and automatic analysis method
AssigneeHitachi High-Tech Corporation
InventorsHiroki Akase, Masahiko Iijima, Chie Yabutani, Takanori Sawada, Rei Konishi
Life of this patent
Estimating the term…
Loading patent…
AssigneeHitachi High-Tech Corporation
InventorsHiroki Akase, Masahiko Iijima, Chie Yabutani, Takanori Sawada, Rei Konishi
Estimating the term…
Addressing the problem of preventing contamination, the present invention is characterized by being provided with a reagent nozzle (H) for discharging a reagent (M1) at a predetermined discharge pressure to a reaction vessel (V) in which a specimen (M2) is accommodated, a control unit for controlling the horizontal position of the reagent nozzle (H) in accordance with the liquid amount of the reagent (M1) and the viscosity of the reagent (M1), a dispensing unit for dispensing the reagent (M1) into the reaction vessel (V), and a photometer for detecting light radiated to a mixture of the specimen (M2) and the reagent (M1), the control unit setting the horizontal position of the reagent nozzle (H) to the center position of the reaction vessel (V) when the liquid amount of the reagent (M1) is greater than the amount of the specimen (M2) and the viscosity of the reagent (M1) is equal to the viscosity of the specimen (M2) or lower than the viscosity of the specimen (M2).
An automatic analysis device, comprising:
An analysis method for an automatic analysis device including:
Dependencies are inferred from the claim text.