X-ray imaging reference scan
AssigneeKoninklijke Philips N.V.
InventorsAndriy Yaroshenko, Thomas Koehler, Peter Benjamin Theodor Nöel, Fabio De Marco, Lukas Benedict Gromann, Konstantin Willer
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AssigneeKoninklijke Philips N.V.
InventorsAndriy Yaroshenko, Thomas Koehler, Peter Benjamin Theodor Nöel, Fabio De Marco, Lukas Benedict Gromann, Konstantin Willer
Estimating the term…
The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector (26) is arranged opposite an X-ray source (12) across an examination region (30) with a grating arrangement (18) arranged between the X-ray source (12) and the X-ray detector (26). During an imaging operation without an object in the examination region (30) the grating arrangement (18) is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector (26) whilst the X-ray detector (26) remains stationary relative to the examination region (30) such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (26). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device (10′″) with less scanning motions.
An X-ray imaging device, comprising:
A method for operating an X-ray imaging device, comprising:
A non-transitory computer-readable medium having one or more executable instructions stored thereon which, when executed by at least one processor, cause the at least one processor to perform a method for operating an X-ray imaging device, the method comprising:
Dependencies are inferred from the claim text.