Impact testing machine
AssigneeShimadzu Corporation
InventorNobuyuki Tokuoka
Life of this patent
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AssigneeShimadzu Corporation
InventorNobuyuki Tokuoka
Estimating the term…
An impact testing machine is configured. The impact testing machine includes: a testing machine body that applies a load having a prescribed speed to a test piece and conducts a test; a controller that controls the testing machine body; a video camera that photographs the test piece; and a pulse generator. The controller includes: a detection signal capturing unit that captures a detection signal of the load in a prescribed measurement sampling period; and a synchronizing signal output unit that outputs a sampling synchronizing signal that is synchronized with the measurement sampling period. The pulse generator includes: a photographing instruction signal generator that generates a photographing instruction signal by multiplying or dividing the sampling synchronizing signal, and outputs the photographing instruction signal to the video camera. The photographing instruction signal issues a photographing instruction to the video camera.
An impact testing machine comprising:
Dependencies are inferred from the claim text.