Systems and methods for determining a thickness of a nonaqueous phase liquid layer
AssigneeAecom
InventorsDaniel Avery Buckley, Brad William Koons, Steven Thomas Gaito, Monal Gajjar
Life of this patent
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Abstract
Various embodiments relate to systems and methods for determining a thickness of a nonaqueous phase liquid layer (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL). The system can include a pressure transducer assembly having a total density value between a first density value of the NAPL and a second density value of the APL. The pressure transducer assembly can be configured to measure a first pressure associated with the pressure exerted by the first layer.
Claims27
A method for measuring a thickness of a first layer of nonaqueous phase liquid (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL), such that an interface between the first and second layers is located at a first depth relative to a reference position, the method comprising:
- determining a first pressure exerted by the first layer with a first pressure transducer assembly including a first pressure transducer, the first pressure transducer assembly having a total density value between a first density value of the NAPL and a second density value of the APL;
- and
- calculating the thickness of the first layer based at least in part on the determined first pressure, a density of the NAPL, a density of the APL, and a distance between the interface and a pressure sensor used to measure the first pressure.
A method for measuring a thickness of a first layer of nonaqueous phase liquid (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL), such that an interface between the first and second layers is located at a first depth relative to a reference position, the method comprising:
- determining a first pressure exerted by the first layer with a first pressure transducer assembly including a first pressure transducer, the first pressure transducer assembly having a total density value between a first density value of the NAPL and a second density value of the APL;
- determining a second pressure associated with a second depth relative to the reference position with a second pressure transducer;
- and
- calculating the thickness of the first layer based at least in part on the determined first pressure.
A method for measuring a thickness of a first layer of nonaqueous phase liquid (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL), such that an interface between the first and second layers is located at a first depth relative to a reference position, the method comprising:
- determining a first pressure exerted by the first layer with a first pressure transducer assembly including a first pressure transducer, wherein the first pressure transducer assembly floats with the interface;
- and
- calculating the thickness of the first layer based at least in part on the determined first pressure, a density of the NAPL, a density of the APL, and a distance between the interface and a pressure sensor used to measure the first pressure.
A method for measuring a thickness of a first layer of nonaqueous phase liquid (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL), such that an interface between the first and second layers is located at a first depth relative to a reference position, the method comprising:
- determining a first pressure exerted by the first layer with a first pressure transducer assembly including a first pressure transducer, wherein the first pressure transducer assembly floats with the interface;
- determining a second pressure associated with a second depth relative to the reference position with a second pressure transducer;
- and
- calculating the thickness of the first layer based at least in part on the determined first pressure.
A system for measuring a thickness of a first layer of nonaqueous phase liquid (NAPL) that is disposed adjacent a second layer of aqueous phase liquid (APL) such that an interface between the first and second layers is located at a first depth relative to a reference position, the system comprising:
- a pressure transducer assembly having a total density value between a first density value of a target NAPL and a second density value of a target APL,
- wherein the pressure transducer assembly is configured to measure a first pressure associated with the pressure exerted by the first layer;
- and
- a second pressure transducer configured to measure a second pressure associated with a second depth relative to the reference position.
Dependencies are inferred from the claim text.