Resist composition, method of forming resist pattern, compound, and acid generator
AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsTakuya Ikeda, Masahiro Shiosaki, Masatoshi Arai, Yoshitaka Komuro
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AssigneeTokyo Ohka Kogyo Co., Ltd.
InventorsTakuya Ikeda, Masahiro Shiosaki, Masatoshi Arai, Yoshitaka Komuro
Estimating the term…
A resist composition containing a compound represented by the general formula (bd1-1), (bd1-2) or (bd1-3); in the formula, Rx1 to Rx4 represent a hydrocarbon group or a hydrogen atom or may be mutually bonded to form a ring structure; Ry1 to Ry2 represent a hydrocarbon group or a hydrogen atom or may be mutually bonded to form a ring structure, Rz1 to Rz4 represent a hydrocarbon group or a hydrogen atom or may be mutually bonded to form a ring structure. At least one of Rx1 to Rx4, Ry1 to Ry2 and Rz1 to Rz4 has an anion group, M1m+ represents a sulfonium cation having a sulfonyl group, R001 to R003 each independently represent a monovalent organic group; provided that at least one of R001 to R003 is an organic group having an acid dissociable group; and M3m+ represents an m-valent organic cation having an electron-withdrawing group.
A resist composition which generates an acid upon exposure and exhibits a changed solubility in a developing solution under the action of acid, the resist composition comprising:
A resist composition which generates an acid upon exposure and exhibits changed solubility in a developing solution under the action of acid, the resist composition comprising:
A compound having an anion moiety and a cation moiety and which is represented by the following general formula (bd1-2):
A resist composition which generates an acid upon exposure and exhibits a changed solubility in a developing solution under the action of acid, the resist composition comprising:
A compound having an anion moiety and a cation moiety and which is represented by the following general formula (bd1-3):
Dependencies are inferred from the claim text.