Method and device for examining a sample
AssigneeBundesrepublik Deutschland, vertreten durch den Bundesminister für Wirtschaft und Energie
InventorsChristoph Strangfeld, Stefan Maack
Life of this patent
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Abstract
A method for examining a sample (50) including the steps of exciting a propagating mechanical deformation (2) in the sample (50) using a fluidic oscillator (10), and determining a characteristic of the mechanical deformation (2).
Claims21
A method for examining a sample, the method comprising:
- generating an excitation signal transported by a free jet originating from a fluidic oscillator, the excitation signal comprising a frequency of at least 16 kHz;
- exciting a propagating mechanical deformation in the sample using the excitation signal;
- determining a characteristic of the mechanical deformation;
- and
- detecting, from the characteristic, at least one of a material property of the sample, a phase boundary in the sample, and a material defect in the sample, whereby the sample is non-destructively examined or non-destructively tested.
A device for examining a sample, comprising:
- a fluidic oscillator for generating an excitation signal for the sample, wherein the fluidic oscillator is configured to generate the excitation signal in such a way that the excitation signal comprises a frequency of at least 16 kHz and is transported by a free jet;
- a detector for detecting an excitation of the sample generated by the excitation signal;
- and
- an evaluation unit coupled to the detector and configured to obtain data generated by the detector during the detection of the excitation, whereby at least one of a material property of the sample, a phase boundary in the sample, and a material defect in the sample are non-destructively detected from the data.
A method for non-destructively examining a sample, comprising exciting a mechanical deformation propagating in the sample using a fluidic oscillator, wherein the mechanical deformation is a sound wave, and wherein the mechanical deformation propagating in the sample comprises a frequency of at least 16 kHz;
- determining a characteristic of the mechanical deformation;
- and detecting, from the characteristic, at least one of a material property of the sample, a phase boundary in the sample, and a material defect in the sample.
Dependencies are inferred from the claim text.