Interferometer systems and methods thereof

A method for making an interferometer system, the method comprising:

• positioning a measurement arm comprising a measurement chromatic lens configured to direct measurement chromatic light towards a fixed target and direct detected measurement light from the received measurement chromatic light towards an output system;
• and
• providing a reference arm comprising a reference optic positioned to receive reference light and direct detected reference light resulting from received reference light towards the output system;
• wherein the measurement arm and the reference arm further comprise a non-transmissive reflective structure with two or more surfaces configured and positioned to direct a received portion of source light towards the measurement arm along a measurement path and another received portion of the source light towards the reference arm along a measurement path that is non-overlapping with the measurement path;
• wherein the non-transmissive reflective structure with two or more surfaces comprises measurement mirrored surfaces and reference mirrored surfaces, wherein an axis extends between the measurement mirrored surfaces and between the reference mirrored surfaces;
• wherein one of the measurement mirrored surfaces on one side of the axis is positioned to direct the received portion of source light towards the measurement dispersive optical system for the measurement chromatic light and wherein another one of the measurement mirrored surfaces on an opposing side of the axis is positioned to direct the detected measurement light received towards the output system;
• wherein one of the reference mirrored surfaces on one side of the axis is positioned to direct the another received portion of the source light towards the reference optic for the reference chromatic light and wherein another one of the reference mirrored surfaces on an opposing side of the axis is positioned to direct the detected reference light received towards the output system comprising a processor is configured to determine at least one measured property of the fixed target from the detected measurement light and the detected reference light.