Predictive process control for a manufacturing process
AssigneeNanotronics Imaging, Inc.
InventorsMatthew C. Putman, John B. Putman, Vadim Pinskiy, Damas Limoge
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AssigneeNanotronics Imaging, Inc.
InventorsMatthew C. Putman, John B. Putman, Vadim Pinskiy, Damas Limoge
Estimating the term…
Aspects of the disclosed technology encompass the use of a deep learning controller for monitoring and improving a manufacturing process. In some aspects, a method of the disclosed technology includes steps for: receiving a plurality of control values from two or more stations, at a deep learning controller, wherein the control values are generated at the two or more stations deployed in a manufacturing process, predicting an expected value for an intermediate or final output of an article of manufacture, based on the control values, and determining if the predicted expected value for the article of manufacture is in-specification. In some aspects, the process can further include steps for generating control inputs if the predicted expected value for the article of manufacture is not in-specification. Systems and computer-readable media are also provided.
A computer-implemented method comprising:
A system comprising:
A non-transitory computer-readable storage medium comprising instructions stored therein, which when executed by one or more processors, cause the one or more processors to perform operations comprising:
Dependencies are inferred from the claim text.