Abnormality determination device and abnormality determination method
AssigneeIHI Corporation
InventorsHatsuo Mori, Keisuke Suzuki, Noriyoshi Mizukoshi, Takashi Ogai
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AssigneeIHI Corporation
InventorsHatsuo Mori, Keisuke Suzuki, Noriyoshi Mizukoshi, Takashi Ogai
Estimating the term…
An abnormality determination device according to one aspect of the present disclosure is an abnormality determination device that determines an abnormality of an inducer used for a pump, the abnormality determination device including a stress-response acquisition unit that acquires a stress response indicating a temporal change in stress applied to the inducer, an accumulated-fatigue-damage-degree calculation unit that calculates an accumulated fatigue-damage degree of the inducer based on the stress response, a lifetime-consumption-rate calculation unit that calculates a lifetime consumption rate that is a changing rate of the accumulated fatigue-damage degree with respect to time, and a determination unit that determines an abnormality of the inducer based on the accumulated fatigue-damage degree and the lifetime consumption rate, in which the inducer is used only for a predetermined use time per operation of the pump.
An abnormality determination device that determines an abnormality of an inducer used for a turbo pump of a rocket, the abnormality determination device comprising:
An abnormality determination method performed by an abnormality determination device that determines an abnormality of an inducer used for a turbo pump of a rocket, the abnormality determination method comprising:
Dependencies are inferred from the claim text.