Solid-state imaging element, imaging device, and control method for solid-state imaging element
AssigneeSony Semiconductor Solutions Corporation
InventorAtsumi Niwa
Life of this patent
Estimating the term…
Abstract
A defective pixel is easily identified in a solid-state imaging element that detects an address event. An address event detecting unit detects, as an address event, a fact that an absolute value of a change amount of luminance exceeds a predetermined threshold value with regard to each of a plurality of pixels, and outputs a detection signal indicating a result of the detection. A detection frequency acquisition unit acquires a detection frequency of the address event with regard to each of the plurality of pixels. A defective pixel identification unit identifies, on the basis of a statistic of the detection frequency, a defective pixel where an abnormality has occurred among the plurality of pixels.
Claims15
A solid-state imaging element comprising:
- an address event detecting unit configured to detect, as an address event, a fact that an absolute value of a change amount of luminance exceeds a predetermined threshold value with regard to each of a plurality of pixels, and output a detection signal indicating a result of the detection;
- a detection frequency acquisition unit configured to acquire a detection frequency of the address event with regard to each of the plurality of pixels;
- and
- a defective pixel identification unit configured to identify, on a basis of a statistic of the detection frequency, a defective pixel where an abnormality has occurred among the plurality of pixels.
A control method for a solid-state imaging element, comprising:
- detecting, as an address event, a fact that an absolute value of a change amount of luminance exceeds a predetermined threshold value with regard to each of a plurality of pixels, and outputting a detection signal indicating a result of the detection;
- acquiring a detection frequency of the address event with regard to each of the plurality of pixels;
- and
- identifying, on a basis of a statistic of the detection frequency, a defective pixel where an abnormality has occurred among the plurality of pixels.
A solid-state imaging device comprising:
- a memory storing program code, and
- a processor configured to execute the program code to perform operations comprising:
- detecting, as an address event, a fact that an absolute value of a change amount of luminance exceeds a predetermined threshold value with regard to each of a plurality of pixels, and output a detection signal indicating a result of the detection;
- acquiring a detection frequency of the address event with regard to each of the plurality of pixels;
- and
- identifying, on a basis of a statistic of the detection frequency, a defective pixel where an abnormality has occurred among the plurality of pixels.
Dependencies are inferred from the claim text.