Driving device and power module
AssigneeMitsubishi Electric Corporation
InventorShinji Sakai
Life of this patent
Estimating the term…
Abstract
To provide a technique to complement overcurrent protection and short circuit protection. An LVIC includes an overcurrent detector configured to detect whether or not a first current flowing through a load and a semiconductor switching element is abnormal and a short-circuit detector configured to detect whether or not a second current flowing not through the load but through the semiconductor switching element is abnormal. The LVIC interrupts the semiconductor switching element based on a detection result of the overcurrent detector and a detection result of the short-circuit detector.
Claims9
A driving device configured to drive a semiconductor switching element connecting to a load, comprising:
- an overcurrent detector configured to detect whether or not a first current flowing through the load and the semiconductor switching element is abnormal;
- and
- a short-circuit detector including a plurality of comparators that provide respective outputs based on respective voltages at the semiconductor switching element, and a timer configured to synchronize the respective outputs of the comparators, such that the short-circuit detector is configured to detect whether or not a second current flowing not through the load and but through the semiconductor switching element is abnormal, wherein
- based on a detection result of the overcurrent detector and a detection result of the short-circuit detector, the semiconductor switching element is interrupted.
A driving device configured to drive a semiconductor switching element connecting to a load, comprising:
- an overcurrent detector configured to detect whether or not a first current flowing through the load and the semiconductor switching element is abnormal;
- and
- a short-circuit detector configured to detect whether or not a second current flowing not through the load and but through the semiconductor switching element is abnormal, wherein
- based on a detection result of the overcurrent detector and a detection result of the short-circuit detector, the semiconductor switching element is interrupted, and
- the short-circuit detector is configured to detect that the second current is abnormal when a voltage based on a drain voltage of the semiconductor switching element is equal to or higher than a threshold value at a time point at which noise has been removed by a filter at the drain voltage of the semiconductor switching element from a time point at which a gate voltage of the semiconductor switching element has exceeded a threshold value.
Dependencies are inferred from the claim text.