Two-dimensional fourier transform mass analysis in an electrostatic linear ion trap
AssigneeDH Technologies Development Pte. Ltd.
InventorEric Thomas Dziekonski
Life of this patent
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AssigneeDH Technologies Development Pte. Ltd.
InventorEric Thomas Dziekonski
Estimating the term…
A mass spectrometer is operated to simultaneously measure precursor and production data over a number of acquisitions. For each acquisition, the following steps are performed. Ion transfer optics inject ions from an ion beam into an ELIT causing the ions to oscillate axially between two electric fields produced by two the sets of reflectrons. The ELIT measures a time domain image current of the oscillating ions from ion injection to a total acquisition time, Tacq1, and fragments the oscillating ions at one or both turning points of the oscillating ions adding product ions to the oscillating ions. The fragmentation is performed at a delay time relative to the ion injection that is increased by a time increment in each subsequent acquisition making the fragmentation dependent on ion position. The measured time domain image current is stored as a row or column of a two-dimensional matrix.
A system for controlling a mass spectrometer to simultaneously measure precursor and product ion data, comprising:
A method for controlling a mass spectrometer to simultaneously measure precursor and product ion data, comprising:
A computer program product, comprising a non-transitory and tangible computer-readable storage medium whose contents include a program with instructions being executed on a processor so as to perform a method for controlling a mass spectrometer to simultaneously measure precursor and product ion data, the method comprising:
Dependencies are inferred from the claim text.