Thermal management for instruments including a plasma source

Abstract

Thermal management arrangements for analysis systems including a plasma source such as inductively-coupled-plasma are disclosed. An analysis system may include a plasma source configured to a plasma source configured to receive and ionize a sample to create an ionized sample, and an instrument such as a mass spectrometer or optical emission spectrometer configured to receive and analyze the ionized sample. A heat shield may be positioned between the plasma source and the instrument, and the heat shield may be constructed and arranged to direct heated gas and/or plasma from the plasma source away from the instrument. In some instances, the heated gas and/or plasma may be extracted from a chamber containing the plasma source.

Dependencies are inferred from the claim text.