Impedance calibration via a number of calibration circuits, and associated methods, devices, and systems

A device, comprising:

• an input/output (I/O) interface area;
• a first ZQ calibration circuit configured to generate a first calibration code for a first portion of the I/O interface area;
• a second ZQ calibration circuit configured to generate a second calibration code for a second portion of the I/O interface area;
• and
• an interpolation circuit coupled to each of the first ZQ calibration circuit and the second ZQ calibration circuit and configured to generate a third calibration code for a third portion of the I/O interface area in response to receipt of the first calibration code and the second calibration code.

A method, comprising:

• determining a first calibration code for a first portion of a input/output (I/O) interface area of a semiconductor device via a first ZQ calibration circuit associated with the first portion;
• determining a second calibration code for a second portion of the I/O interface area of the semiconductor device via a second ZQ calibration circuit associated with the second portion;
• and
• determining a third calibration code for a third portion of the I/O interface area of the semiconductor device based on the first calibration code and the second calibration code, the third portion positioned at least partially between the first portion and the second portion.

A method, comprising:

• determining a first calibration code for a first portion of a input/output (I/O) interface area of a semiconductor device via a first ZQ calibration circuit associated with the first portion;
• determining a second calibration code for a second portion of the I/O interface area of the semiconductor device via a second ZQ calibration circuit associated with the second portion;
• tuning the first portion of the I/O interface area based on the first calibration code;
• tuning the second portion of the I/O interface area based on the second calibration code;
• and
• determining, via an interpolation circuit, a third calibration code for a third portion of the I/O interface area based on the first calibration code and the second calibration code.

A system, comprising:

• at least one input device;
• at least one output device;
• at least one processor device operably coupled to the input device and the output device;
• and
• at least one memory device operably coupled to the at least one processor device and comprising:
• an input/output (I/O) interface including a number of areas;
• a first ZQ calibration circuit positioned adjacent to a first area of the number of areas of the I/O interface area;
• a second ZQ calibration circuit positioned adjacent to a second area of the number of areas of the I/O interface area;
• and
• a first interpolation circuit coupled to each of the first ZQ calibration circuit and the second ZQ calibration circuit and positioned adjacent to a third area of the number of areas of the I/O interface area, the third area at least partially positioned between the second area and the first area.