Techniques for read operations
AssigneeMicron Technology, Inc.
InventorsFerdinando Bedeschi, Riccardo Muzzetto, Umberto Di Vincenzo
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AssigneeMicron Technology, Inc.
InventorsFerdinando Bedeschi, Riccardo Muzzetto, Umberto Di Vincenzo
Estimating the term…
Methods, systems, devices, and techniques for read operations are described. In some examples, a memory device may include a first transistor (e.g., memory node transistor) configured to receive a precharge voltage at a first gate and output first voltage based on a threshold of the first transistor to a reference node via a first switch. The device may include a second transistor (e.g., a reference node transistor) configured to receive a precharge voltage and output a second voltage based on a threshold of the second transistor to a memory node via a second switch. The first voltage may be modified by a reference voltage and input to the second transistor. The second voltage may be modified by a voltage stored on a memory cell and input to the first transistor. The first and second transistor may output third and fourth voltages to be sampled to a latch.
An apparatus, comprising:
A method, comprising:
An apparatus, comprising:
Dependencies are inferred from the claim text.