Processing method for applying analog dynamic circuit to digital testing tool

Abstract

A processing method for applying an analog dynamic circuit to a digital testing tool includes the following steps. In a step (a), a transistor-level analog dynamic circuit is provided. In a step (b), plural equivalent models are designed according to operations of plural transistors in the transistor-level analog dynamic circuit. In a step (c), a substitution operation is performed to substitute the equivalent models for dynamic logic elements in the transistor-level analog dynamic circuit. Consequently, a gate-level substitution circuit is produced. In a step (d), the gate-level substitution circuit is imported into a digital testing tool. Consequently, a test pattern is generated. In a step (e), the transistor-level analog dynamic circuit is tested according to the test pattern.

Dependencies are inferred from the claim text.