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US 11,144,162 B1Granted
Device and method for sensor electrode testing
AssigneeSynaptics Incorporated
InventorsNobukazu Tanaka, Takayuki Noto
Life of this patent
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Abstract
A method for testing a sensor electrode is provided. The method includes acquiring a first resulting signal from a sensor electrode. The method further includes determining an in-phase response and a quadrature-phase response through a quadrature demodulation based on the first resulting signal. The method further includes detecting a defect of the sensor electrode based on the in-phase response and the quadrature-phase response.
Claims20
A method, comprising:
- acquiring a first resulting signal from a sensor electrode;
- determining an in-phase response and a quadrature-phase response through a quadrature demodulation based on the first resulting signal;
- and
- detecting a defect of the sensor electrode based on the in-phase response and the quadrature-phase response.
1 more element
A processing system, comprising:
- capacitive sensing circuitry configured to:
- acquire a first resulting signal from a sensor electrode;
- apply a quadrature demodulation to the first resulting signal to determine an in-phase response and a quadrature-phase response;
- and
- a processor configured to detect a defect of the sensor electrode based on the in-phase response and the quadrature-phase response.
2 more elements
An input device, comprising:
- a sensor array comprising a sensor electrode;
- and
- a processing system configured to:
- acquire a first resulting signal from the sensor electrode used for capacitive proximity sensing;
- apply a quadrature demodulation to the first resulting signal to determine an in-phase response and a quadrature-phase response;
- and
- detect a defect of the sensor electrode based on the in-phase response and the quadrature-phase response.
4 more elements
Dependencies are inferred from the claim text.