Device for estimating degradation of secondary cell, and method for estimating degradation of secondary cell
AssigneesFurukawa Electric Co., Ltd., Furukawa Automotive Systems Inc.
InventorsTaiji Mitsuyama, Etsuzo Sato, Noriyasu Iwane, Naotaka Uchino, Hirokazu Narui, Akira Oono, Takayuki Morikawa
Life of this patent
Estimating the term…