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US 11,143,698 B2Granted
Methods and apparatus for optical transceiver calibration and test
AssigneeJuniper Networks, Inc.
InventorsRoberto Marcoccia, Theodore J. Schmidt, George R. Sosnowski, Christian Malouin
Life of this patent
Estimating the term…
Abstract
In some embodiments, an apparatus includes an automatic integrated circuit (IC) handler having a change kit. The change kit has a plunger moveably disposable onto an automatic test equipment (ATE). In such embodiments, the ATE is configured to receive an integrated circuit having an optical interface. The plunger has a first position and a second position. In such embodiments, the plunger is out of contact with the integrated circuit when the plunger is in the first position. The plunger includes an optical connector operatively coupled to the optical interface of the integrated circuit when the plunger is in the second position.
Claims18
An apparatus, comprising:
- an automatic integrated circuit (IC) handler having a first change kit, the first change kit having a plunger with an optical connector, the plunger configured to be moveable between a first position and a second position and moveably disposable onto an Automatic Test Equipment (ATE) that received a first integrated circuit having an optical interface,
- (1) the plunger configured to be out of contact with the first integrated circuit when the plunger is in the first position,
- (2) the plunger configured to be operatively coupled, via the optical connector of the plunger, to the optical interface of the first integrated circuit in response to the plunger moving from the first position and stopping at the second position, and
- (3) the first integrated circuit being in contact with the ATE and not moveable with the plunger when the plunger moves between the first position and the second position;
- the automatic IC handler configured to have a second change kit, different from the first change kit, to test optical and electrical properties of a second integrated circuit received by the ATE and having a size different from a size of the first integrated circuit.
2 more elements
A method, comprising:
- receiving, at an Automatic Test Equipment (ATE), a first integrated circuit having an optical interface when a plunger of a first change kit of an automatic integrated circuit (IC) handler is out of contact with the first integrated circuit at a first position;
- testing, using an optical filter of the automatic IC handler and when the plunger is in contact with the first integrated circuit at a second position, at least one wavelength of an optical fiber of the first integrated circuit, the plunger optically coupled to the optical interface of the first integrated circuit in response to the plunger moving from the first position and stopping at the second position;
- testing, using an optical detector of the automatic IC handler and when the plunger is at the second position, an optical power of the optical fiber of the first integrated circuit;
- receiving, at the ATE, a second integrated circuit having a size different from a size of the first integrated circuit;
- testing at least one wavelength of an optical fiber of the second integrated circuit;
- and
- testing, using the automatic IC handler with a second change kit different from the first change kit, an optical power of the optical fiber of the second integrated circuit.
4 more elements
An apparatus, comprising:
- an automatic integrated circuit (IC) handler having a first change kit having a plunger moveably disposable with an automatic test equipment (ATE),
- the ATE configured to receive a first integrated circuit having a first optical interface,
- the plunger having an optical connector and an electrical connector, the optical connector of the plunger configured to be operatively coupled to the first optical interface of the first integrated circuit, the electrical connector of the plunger configured to be operatively coupled to at least one of the first integrated circuit or the ATE,
- the automatic IC handler configured to test at least one wavelength of a first optical fiber of the first integrated circuit,
- the ATE configured to receive a second integrated circuit having a second optical interface, the second integrated circuit having a second size different from a first size of the first integrated circuit,
- the automatic IC handler having a second change kit different from the first change kit and configured to test at least one wavelength of a second optical fiber of the second integrated circuit.
3 more elements
Dependencies are inferred from the claim text.