Automated handling of different form factor devices under test in test cell
AssigneeAdvantest Corporation
InventorRoland Wolff
Life of this patent
Estimating the term…
Abstract
A system for performing tests using automated test equipment (ATE) is disclosed. The system comprises a robot comprising an end effector operable to pick up and transfer a DUT in-and-out of a test slot in a primitive. The system further comprises a system controller comprising a memory and a processor for controlling the robot. Also, the system comprises a test rack comprising a plurality of primitives, wherein the primitive is a modular device comprising a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to access slots in the plurality of primitives within the test rack using the end effector.
Claims27
A method for performing tests using automated test equipment (ATE), the method comprising:
- locating and grasping a device under test (DUT) to be tested;
- recording a presence of the DUT in a database;
- querying the database to determine if an empty slot is present in a device interface board (DIB), wherein the DIB comprises a plurality of slots for testing a plurality of DUTs, and wherein the DIB is associated with a primitive comprising test circuitry for performing a test plan on the DUT, and wherein the primitive comprises an enclosure and operates independently from other primitives in the ATE;
- using a robot to automatically position and insert the DUT in the empty slot;
- reporting to the database that the empty slot has been filled;
- and
- initiating testing on the DUT.
A system for performing tests using automated test equipment (ATE), the system comprising:
- a robot comprising an end effector operable to automatically pick up and transfer a Device Under Test (DUT) in-and-out of a test slot in a device interface board (DIB) within a primitive;
- a system controller comprising a memory and a processor for controlling the robot;
- and
- a test rack comprising a plurality of primitives, wherein each primitive is a modular device comprising a DIB, wherein the DIB comprises a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to automatically access slots in a respective DIB associated with each of the plurality of primitives within the test rack using the end effector, wherein each primitive of the plurality of primitives comprises test circuitry for performing a test plan on the DUT, and wherein each primitive of the plurality of primitives comprises an enclosure and operates independently from other primitives in the plurality of primitives.
A system for performing tests using automated test equipment (ATE), the system comprising:
- a robot comprising an end effector operable to automatically grasp and pick up and transfer a Device Under Test (DUT) in-and-out of a test slot in a device interface board (DIB) within a primitive;
- an input and output module comprising a plurality of trays and operable to present DUTs from the plurality of trays to the robot during testing;
- a system controller comprising a memory and a processor for controlling the robot;
- and
- a test rack comprising a plurality of primitives, wherein each primitive is a modular device comprising a DIB, wherein the DIB comprises a plurality of slots for testing a plurality of DUTs, and wherein the robot is configured to access slots in a respective DIB associated with each of the plurality of primitives within the test rack, wherein each primitive of the plurality of primitives comprises test circuitry for performing a test plan on the DUT, and wherein each primitive of the plurality of primitives comprises an enclosure and operates independently from other primitives in the plurality of primitives.
Dependencies are inferred from the claim text.