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US 11,143,694 B2Granted
Wide injection range open circuit voltage decay system
AssigneeTexas Tech University System
InventorsShelby Lacouture, Stephen Bayne
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Abstract
A system, method and apparatus for measuring carrier lifetime of a device comprises subjecting a test device to a voltage via a voltage source associated with the test system, disconnecting the test device from the voltage source, measuring the voltage as a function of time, measuring the current as a function of time, and determining a carrier lifetime of the test piece according to the slope of the measured voltage and the measured current.
Claims20
A system comprising:
- a voltage source;
- a switch configured to disconnect a test piece from said voltage source;
- an assembly configured to collect a voltage versus time measurement and a current versus time measurement;
- and
- an analytics module comprising at least one processor and a storage device communicatively coupled to the at least one processor, the storage device comprising non-transitory computer-readable media which, when executed by the at least one processor, cause the at least one processor to perform operations comprising:
- identifying a carrier lifetime of said test piece according to said measured voltage versus time and said measured current versus time.
3 more elements
An analytics apparatus comprising:
- a voltage source;
- a switch configured to disconnect a test piece from said voltage source;
- an assembly for measuring a voltage versus time and a current versus time;
- and
- an analytics module comprising at least one processor and a storage device communicatively coupled to the at least one processor, the storage device comprising non-transitory computer-readable media which, when executed by the at least one processor, cause the at least one processor to perform operations comprising:
- identifying a carrier lifetime of said test piece according to said measured voltage versus time and said measured current versus time.
3 more elements
A method for measuring carrier lifetime said method comprising:
- subjecting a test device to a voltage via a voltage source associated with a test system;
- disconnecting said test device from said voltage source;
- measuring a voltage as a function of time;
- measuring a current as a function of time;
- and
- determining a carrier lifetime of said test device according to said measured voltage and said measured current.
3 more elements
Dependencies are inferred from the claim text.