Automatic analyzer
AssigneeHitachi High-Tech Corporation
InventorsAkihiro Yasui, Gorou Yoshida, Yoshiki Muramatsu, Isao Yamazaki
Life of this patent
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Abstract
An automatic analyzer (100) includes: a storage unit (21b) that stores various parameters of the automatic analyzer (100) in association with each of elevations used in the automatic analyzers (100), the parameters being optimized for each of the elevations; an input unit (21d) that acquires information of an elevation at which the automatic analyzer (100) is provided; and a controller (21a) that reads the parameters stored in the storage unit (21b) and sets the read parameters to the automatic analyzer (100) based on the elevation acquired by the input unit (21d). As a result, various parameters can be easily adjusted according to a usage environment of the device.
Claims5
An automatic analyzer comprising:
- a reagent disk on which a plurality of reagent containers each containing a reagent used for analyzing a sample are loaded;
- a reaction disk on which a plurality of reaction containers where the sample and the reagent react with each other are arranged;
- a sample dispensing mechanism that dispenses the sample by absorbing the sample by dipping a sample dispensing nozzle into the sample contained in a sample container and discharging the absorbed sample into the reaction container of the reaction disk by using a syringe pump, the sample dispensing mechanism including a pressure sensor provided in a flow path between the syringe pump and the sample dispensing nozzle;
- a reagent dispensing mechanism that dispenses the reagent by absorbing the reagent by dipping a reagent dispensing nozzle into the reagent contained in the reagent container and discharging the absorbed reagent into the reaction container of the reaction disk;
- a reaction measuring unit that measures a reaction from a reaction solution of the sample and the reagent in the reaction container;
- a storage device configured to store a plurality of parameters of the automatic analyzer in association with each of a plurality of stored elevations in which the automatic analyzer is used, the plurality of parameters being optimized for each of the plurality of stored elevations, respectively;
- and
- a processor configured to:
- acquire information of an input elevation at which the automatic analyzer is provided;
- read a parameter of the plurality of parameters stored in the storage device for absorption abnormalities determination and set the read parameter to the automatic analyzer based on the input elevation;
- and
- determine the absorption abnormalities of the sample dispensing nozzle using pressures detected by the pressure sensor and the parameter set to the automatic analyzer,
- wherein at least one of the plurality of parameters of the automatic analyzer stored in association with each of the plurality of stored elevations includes information of a replacement cycle of a component included in the automatic analyzer.
Dependencies are inferred from the claim text.