Dark field tensor tomography method, specimen holder and device
AssigneeTechnische Universität München
InventorsFlorian Schaff, Franz Pfeiffer
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Abstract
The invention relates to an X-ray CT method and in particular a registration-based dark-field tensor tomography method for testing a sample (60) by means of X-rays, with which method a sample (60) is consecutively scanned by means of X-rays in at least two fixed orientations differing from one another while rotating about a fixed rotation axis, in every orientation of the sample (60) on the basis of dark-field signals a plurality of scatter data sets is recorded, and the scatter data sets for different orientations are matched to one another by registration and combined into a common scatter data set reflecting a possible angular dependence of the scatter present due to the sample (60).
Claims5
An X-ray CT method for testing a sample (60) by means of X-rays, the method comprising:
- consecutively scanning a sample (60) by means of X-rays in at least two fixed orientations differing from one another while rotating about a fixed rotation axis (81),
- recording a plurality of scatter data sets in every orientation of the sample (60) on the basis of dark-field signals, and
- matching the scatter data sets for different orientations to one another by registration and combining into a common scatter data set reflecting a possible angular dependence of scattering due to the sample (60),
- wherein the rotation axis (81) for an orientation of the sample (60) is aligned perpendicular or substantially perpendicular to grating lines of identically oriented first, second and third grating elements (31, 32, 33) of a grating arrangement (30) that are disposed between a radiation source (20) and a detector arrangement (40) in a ray path (26).
Dependencies are inferred from the claim text.