Measuring current generation circuit
AssigneeuPI Semiconductor Corp.
InventorsYi-Xian Jan, Chien-Hsien Tsai, Kuo-Jen Kuo, Chao-Chung Huang, Chien-Kuei Chan
Life of this patent
Estimating the term…
Loading patent…
AssigneeuPI Semiconductor Corp.
InventorsYi-Xian Jan, Chien-Hsien Tsai, Kuo-Jen Kuo, Chao-Chung Huang, Chien-Kuei Chan
Estimating the term…
A measuring current generation circuit coupled to a setting resistor is disclosed. The generation circuit includes a first measuring terminal, a second measuring terminal, a first transconductance amplifier, a second transconductance amplifier and an output circuit. The first transconductance amplifier has a first input terminal and a second input terminal. The first input terminal is coupled to one terminal of the setting resistor. The second input terminal is coupled to another terminal of the setting resistor and coupled to the first measuring terminal. The second transconductance amplifier has a third input terminal and a fourth input terminal. The output circuit is coupled to output terminals of the first transconductance amplifier and the second transconductance amplifier respectively and has a first output terminal and a second output terminal. The first output terminal is coupled to the first input terminal. The second output terminal is coupled to the second measuring terminal.
A measuring current generation circuit, coupled to a setting resistor, comprising:
Dependencies are inferred from the claim text.