Salts and crystal forms of diaza-benzofluoranthrene compounds
AssigneeHarbin Pharmaceutical Group Co., Ltd. General Pharmaceutical Factory
InventorsQingqing Lu, Shenyi Shi, Tiezhong Bai, Shujie Yuan, Zhengwu Li, Qiaofen Hu, Yijie Cao, Jing Gao, Hui Ding, Jinhua Li, Guanghai Xu, Zheng Wang, Xin Jin
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Abstract
The present invention discloses to a hydrochloride salt, a citrate salt, a phosphate salt or a sulfate salt of compound 1, the crystal forms of the aforementioned salts, and a preparation method thereof. The present invention also relates their use in the preparation of a medicament for the treatment of cerebral apoplexy or epilepsy.
Claims37
A crystal form A of a compound of formula (I)
- wherein an X-ray powder diffraction pattern of the crystal form A has characteristic diffraction peaks at 2θ angles of 9.14±0.2°, 10.43±0.2°, 11.38±0.2°, 12.54±0.2°, 13.86±0.2°, 19.04±0.2°, 19.36±0.2°, 21.00±0.2°.
A crystal form B of a compound of formula (I)
- wherein an X-ray powder diffraction pattern of the crystal form B has characteristic diffraction peaks at 2θ angles of 9.17±0.2°, 11.75±0.2°, 12.16±0.2°, 12.67±0.2°, 15.14±0.2°, 17.81±0.2°, 20.54±0.2°, 22.34±0.2°.
A crystal form C of a compound of formula (II)
- wherein an X-ray powder diffraction pattern of the crystal form C has characteristic diffraction peaks at 2θ angles of 14.04±0.2°, 16.28±0.2°, 16.70±0.2°, 17.73±0.2°, 18.18±0.2°, 20.29±0.2°, 23.40±0.2°, 25.95±0.2°.
A crystal form D of a compound of formula (III)
- wherein an X-ray powder diffraction pattern of the crystal form D has characteristic diffraction peaks at 2θ angles of 4.47±0.2°, 9.80±0.2°, 10.67±0.2°, 13.05±0.2°, 16.30±0.2°, 16.80±0.2°, 17.65±0.2°, 17.82±0.2°.
A crystal form E of a compound of formula (IV)
- wherein an X-ray powder diffraction pattern of the crystal form E has characteristic diffraction peaks at 2θ angles of 4.71±0.2°, 12.30±0.2°, 16.26±0.2°, 16.78±0.2°, 19.80±0.2°, 23.70±0.2°, 25.65±0.2°, 26.22±0.2°.
A crystal form F of a compound of formula (IV)
- wherein an X-ray powder diffraction pattern of the crystal form F has characteristic diffraction peaks at 2θ angles of 5.79±0.2°, 9.75±0.2°, 14.03±0.2°, 15.67±0.2°, 17.46±0.2°, 18.86±0.2°, 20.42±0.2°, 20.99±0.2°.
A crystal form G of a compound of formula (V)
- wherein an X-ray powder diffraction pattern of the crystal form G has characteristic diffraction peaks at 2θ angles of 4.59±0.2°, 12.24±0.2°, 15.93±0.2°, 16.66±0.2°, 18.46±0.2°, 19.72±0.2°, 22.10±0.2°, 23.56±0.2°.
A crystal form H of a compound of formula (V)
- wherein an X-ray powder diffraction pattern of the crystal form H has characteristic diffraction peaks at 2θ angles of 5.85±0.2°, 8.80±0.2°, 9.87±0.2°, 12.47±0.2°, 14.06±0.2°, 17.62±0.2°, 18.70±0.2°, 20.58±0.2°.
Dependencies are inferred from the claim text.