Radical output monitor for a remote plasma source and method of use
AssigneeMKS Instruments, Inc.
InventorsMichael Harris, Chiu-Ying Tai, Atul Gupta
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AssigneeMKS Instruments, Inc.
InventorsMichael Harris, Chiu-Ying Tai, Atul Gupta
Estimating the term…
The present application discloses a device for radical monitoring a plasma source for a remote plasma source used in a processing system and includes at least one gas source, a plasma source body having at least one passage having at least one passage surface, a first thermal sensor receiver may be formed within the plasma source body proximate to the passage surface of the passage, a first thermal sensor positioned within the first thermal sensor receiver configured to measure a first temperature of the passage surface, a second thermal sensor receiver formed within the plasma source body proximate to the passage surface of the passage and configured to measure a second temperature of the passage surface of the passage at a second location.
A plasma source for a processing system, comprising:
A plasma source for a processing system, comprising:
A method of monitoring the radical output from a plasma source, comprising:
Dependencies are inferred from the claim text.