Sixth-order and above corrected STEM multipole correctors
AssigneeFEI Company
InventorsAlexander Henstra, Peter Christiaan Tiemeijer, Marcel Niestadt
Life of this patent
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AssigneeFEI Company
InventorsAlexander Henstra, Peter Christiaan Tiemeijer, Marcel Niestadt
Estimating the term…
Correctors for correcting axial aberrations of a particle-optical lens in a charged particle microscope system, according to the present disclosure include a first primary multipole that generates a first primary multipole field when a first excitation is applied to the first primary multipole, and a second primary multipole that generates a second primary multipole field when a second excitation is applied to the second primary multipole. The first primary multipole is not imaged onto the second primary multipole such that a combination fourth-order aberration is created. The correctors further include a secondary multipole for correcting the fourth-order aberration and the sixth-order aberration. Such correctors may further include a tertiary multipole for correcting an eighth-order aberration.
A corrector for correcting axial aberrations in a charged particle microscope system, the corrector comprising:
A corrector for correcting axial aberrations in a charged particle system, the corrector comprising:
A charged particle system comprising:
Dependencies are inferred from the claim text.