# US 11,113,445 B2 · Hotspot detection based on litho-aware machine learning

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- Number: US 11,113,445 B2
- Document ID: US11113445B2
- Status: Granted
- Kind: B2
- Application number: 16/135,236
- Filed: 2018-09-19
- Published: 2019-03-21
- Granted: 2021-09-07
- Earliest claimed: 2017-09-20
- Assignees: Siemens Industry Software Inc.
- Applicants: Mentor Graphics Corporation
- Inventors: Jea Woo Park; Juan Andres Torres Robles
- Web page: https://patentgrep.com/patent/US11113445B2

## CPC

- G06F 30/398: Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM] (optical proximity correction [OPC] design processes G03F1/36)
- G03F 7/70433: {Layout for increasing efficiency or for compensating imaging errors, e.g. layout of exposure fields for reducing focus errors; Use of mask features for increasing efficiency or for compensating imaging errors}
- G03F 7/705: {Modelling or simulating from physical phenomena up to complete wafer processes or whole workflow in wafer productions}
- G06F 30/18: Network design, e.g. design based on topological or interconnect aspects of utility systems, piping, heating ventilation air conditioning [HVAC] or cabling (circuit design at the physical level G06F30/39; network planning tools for wireless communication networks H04W16/18)
- G06N 20/00: Machine learning
- G06N 20/10: using kernel methods, e.g. support vector machines [SVM]
- G06F 30/20: Design optimisation, verification or simulation (optimisation, verification or simulation of circuit designs G06F30/30)
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)
- G03F: PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR; (phototypographic composing devices B41B; photosensitive materials or processes for photographic purposes G03C; electrophotography, sensitive layers or processes therefor G03G)
- G06N: COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS

## Abstract

Aspects of the disclosed technology relate to techniques of hotspot detection. Pinching-type hotspot candidates and bridging-type hotspot candidates are first identified in the layout design based on predetermined criteria. Simulation is then performed to derive aerial image intensity values for a plurality of sites on each of the pinching-type and bridging-type hotspot candidates. Pinching-type hotspots are determined from the pinching-type hotspot candidates based on one or more machine learning models for pinching-type hotspots, and bridging-type hotspots are determined from the bridging-type hotspot candidates based on one or more machine learning models for bridging-type hotspots. The input vector for the machine learning models is the aerial image intensity values for the plurality of sites.

## Claims

### Claim 1

A method, executed by at least one processor of a computer, comprising:
receiving a layout design;
identifying pinching-type hotspot candidates and bridging-type hotspot candidates in the layout design based on predetermined criteria;
performing simulation to derive aerial image intensity values for a plurality of sites on each of the pinching-type hotspot candidates and for a plurality of sites on each of the bridging-type hotspot candidates;
determining pinching-type hotspots from the pinching-type hotspot candidates based on one or more machine learning models for pinching-type hotspots and bridging-type hotspots from the bridging-type hotspot candidates based on one or more machine learning models for bridging-type hotspots, the input for the one or more machine learning models for pinching-type hotspots being the aerial image intensity values for the plurality of sites on each of the pinching-type hotspot candidates, the input for the one or more machine learning models for bridging-type hotspots being the aerial image intensity values for the plurality of sites on each of the bridging-type hotspot candidates;
storing information of the pinching-type hotspots and the bridging-type hotspots; and
thereafter finalizing the layout design to repair the pinching-type hotspots and the bridging-type hotspots, and manufacturing a circuit according to the finalized layout design using a photolithographic process.

### Claim 2 (depends on 1)

The method recited in claim 1, wherein the one or more machine learning models for pinching-type hotspots comprise a machine learning model for horizontal pinching-type hotspots and a machine learning model for vertical pinching-type hotspots, the one or more machine learning models for bridging-type hotspots comprise a machine learning model for horizontal bridging-type hotspots and a machine learning model for vertical bridging-type hotspots, the pinching-type hotspot candidates are separated into a group of horizontal pinching-type hotspot candidates and a group of vertical pinching-type hotspot candidates, and the bridging-type hotspot candidates are separated into a group of horizontal bridging-type hotspot candidates and a group of vertical bridging-type hotspot candidates.

### Claim 3 (depends on 1)

The method recited in claim 1, wherein the predetermined criteria may be set according to design checking rules.

### Claim 4 (depends on 1)

The method recited in claim 1, wherein the one or more machine learning models for pinching-type hotspots and the one or more machine learning models for bridging-type hotspots are C-type Support Vector Machine models.

### Claim 5 (depends on 1)

The method recited in claim 1, wherein a number of the plurality of sites is greater than 8 and less than 20.

### Claim 6

One or more non-transitory computer-readable media storing computer-executable instructions for causing one or more processors to perform a method, the method comprising:
receiving a layout design;
identifying pinching-type hotspot candidates and bridging-type hotspot candidates in the layout design based on predetermined criteria;
performing simulation to derive aerial image intensity values for a plurality of sites on each of the pinching-type hotspot candidates and for a plurality of sites on each of the bridging-type hotspot candidates;
determining pinching-type hotspots from the pinching-type hotspot candidates based on one or more machine learning models for pinching-type hotspots and bridging-type hotspots from the bridging-type hotspot candidates based on one or more machine learning models for bridging-type hotspots, the input for the one or more machine learning models for pinching-type hotspots being the aerial image intensity values for the plurality of sites on each of the pinching-type hotspot candidates, the input for the one or more machine learning models for bridging-type hotspots being the aerial image intensity values for the plurality of sites on each of the bridging-type hotspot candidates;
storing information of the pinching-type hotspots and the bridging-type hotspots; and
finalizing the layout design to repair the pinching-type hotspots and the bridging-type hotspots, wherein a circuit is thereafter manufactured according to the finalized layout design using a photolithographic process.

### Claim 7 (depends on 6)

The one or more non-transitory computer-readable media recited in claim 6, wherein the one or more machine learning models for pinching-type hotspots comprise a machine learning model for horizontal pinching-type hotspots and a machine learning model for vertical pinching-type hotspots, the one or more machine learning models for bridging-type hotspots comprise a machine learning model for horizontal bridging-type hotspots and a machine learning model for vertical bridging-type hotspots, the pinching-type hotspot candidates are separated into a group of horizontal pinching-type hotspot candidates and a group of vertical pinching-type hotspot candidates, and the bridging-type hotspot candidates are separated into a group of horizontal bridging-type hotspot candidates and a group of vertical bridging-type hotspot candidates.

### Claim 8 (depends on 6)

The one or more non-transitory computer-readable media recited in claim 6, wherein the predetermined criteria may be set according to design checking rules.

### Claim 9 (depends on 6)

The one or more non-transitory computer-readable media recited in claim 6, wherein the one or more machine learning models for pinching-type hotspots and the one or more machine learning models for bridging-type hotspots are C-type Support Vector Machine models.

### Claim 10 (depends on 6)

The one or more non-transitory computer-readable media recited in claim 6, wherein a number of the plurality of sites is greater than 8 and less than 20.

### Claim 11

A system, comprising:
one or more processors, the one or more processors programmed to perform a method, the method comprising:
receiving a layout design;
identifying pinching-type hotspot candidates and bridging-type hotspot candidates in the layout design based on predetermined criteria;
performing simulation to derive aerial image intensity values for a plurality of sites on each of the pinching-type hotspot candidates and for a plurality of sites on each of the bridging-type hotspot candidates;
determining pinching-type hotspots from the pinching-type hotspot candidates based on one or more machine learning models for pinching-type hotspots and bridging-type hotspots from the bridging-type hotspot candidates based on one or more machine learning models for bridging-type hotspots, the input for the one or more machine learning models for pinching-type hotspots being the aerial image intensity values for the plurality of sites on each of the pinching-type hotspot candidates, the input for the one or more machine learning models for bridging-type hotspots being the aerial image intensity values for the plurality of sites on each of the bridging-type hotspot candidates;
storing information of the pinching-type hotspots and the bridging-type hotspots; and
finalizing the layout design to repair the pinching-type hotspots and the bridging-type hotspots, wherein a circuit is thereafter manufactured according to the finalized layout design using a photolithographic process.

### Claim 12 (depends on 11)

The system recited in claim 11, wherein the one or more machine learning models for pinching-type hotspots comprise a machine learning model for horizontal pinching-type hotspots and a machine learning model for vertical pinching-type hotspots, the one or more machine learning models for bridging-type hotspots comprise a machine learning model for horizontal bridging-type hotspots and a machine learning model for vertical bridging-type hotspots, the pinching-type hotspot candidates are separated into a group of horizontal pinching-type hotspot candidates and a group of vertical pinching-type hotspot candidates, and the bridging-type hotspot candidates are separated into a group of horizontal bridging-type hotspot candidates and a group of vertical bridging-type hotspot candidates.

### Claim 13 (depends on 11)

The system recited in claim 11, wherein the predetermined criteria may be set according to design checking rules.

### Claim 14 (depends on 11)

The system recited in claim 11, wherein the one or more machine learning models for pinching-type hotspots and the one or more machine learning models for bridging-type hotspots are C-type Support Vector Machine models.

### Claim 15 (depends on 11)

The system recited in claim 11, wherein a number of the plurality of sites is greater than 8 and less than 20.
